Evaluation of Aging State of Wire Insulation Materials Based on Raman Spectroscopy

Yuan-chao FAN; Xiao-jing CHEN; Guang-zao HUANG; Lei-ming YUAN; Wen SHI; Xi CHEN

doi:10.3964/j.issn.1000-0593(2022)10-3161-07

Journals >Spectroscopy and Spectral Analysis >Volume 42 >Issue 10 >Page 3161 > Article

Spectroscopy and Spectral Analysis
Vol. 42, Issue 10, 3161 (2022)

Evaluation of Aging State of Wire Insulation Materials Based on Raman Spectroscopy

Yuan-chao FAN^*, Xiao-jing CHEN^*;, Guang-zao HUANG, Lei-ming YUAN, Wen SHI, and Xi CHEN

Author Affiliations

College of Electrical and Electronic Engineering, Wenzhou University, Wenzhou 325035, China

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DOI: 10.3964/j.issn.1000-0593(2022)10-3161-07 Cite this Article

Yuan-chao FAN, Xiao-jing CHEN, Guang-zao HUANG, Lei-ming YUAN, Wen SHI, Xi CHEN. Evaluation of Aging State of Wire Insulation Materials Based on Raman Spectroscopy[J]. Spectroscopy and Spectral Analysis, 2022, 42(10): 3161 Copy Citation Text

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References

[2] X Han, L Lu, M Ouyang et al. Journal of Power Sources, 268, 658(2014).

[5] X Chen, L M Yuan, Q Xia et al. Applied Sciences, 9, 5336(2019).

[9] Shan Chen, Yizeng Liang, Zhimin Zhang. Analyst, 135, 1138(2010).

[10] X Feng, Z Xie, L Meng et al. Plasma Science and Technology, 22, 085503(2020).

[11] R Togneri, M Bennamoun, I Naseem. IEEE Transactions on Pattern Analysis & Machine Intelligence, 32, 2106(2010).

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