[5] Wu Hanping. Research into testing scheme of reliability qualification of complex optoeletronic systems[J]. Optics and Precision Engineering, 1997, 5(5): 112-120. (in Chinese)
[7] Xavier Breniere, Philippe Tribolet. IR detectors design and approach for tactical applications with high reliability without maintenance[C]//SPIE, 2008, 6940: 69400H.
[8] Xavier Breniere, Alain Manissadjian, Michel Vuillermet, et al. Reliability optimization for IR detectors with compact cryo-cooler [C]//SPIE, 2005, 5783: 607591.
[9] Xavier Breniere, Philippe Tribolet. IR detectors life cycle cost and reliability optimization for tactical application [C]//SPIE, 2006, 6395: 63950D.
[10] Marianne Molina,Xavier Breniere, Philippe Tribolet. IR detector Dewar and assemblies for stringent environmental conditions [C]//SPIE, 2007, 6542: 65422N.
[11] Davis M, Devitt J. Advanced FPA technology development at CMC Electronics[C]//SPIE, 2004, 5563.
[12] Zhu Yingfeng,Han Fuzhong, Li Dongsheng, et al. MW 320×256 IRFPA detector under rapid cooling down[J]. Infrared and Laser Engineering, 2014, 43(4): 1032-1036. (in Chinese)
[13] Meng Chao, Peng Jing, Ma Wei. Study on reliability enhancement testing for InSb focal plane array detector[C]//SPIE, 2012, 8193.
[14] Ren Ren, Wu Ligang, Wang Xiaokun, et al. Study on the thermal cycle characteristic of HgCdTe detector[J]. Laser & Infrared, 2007, 37: 941-943. (in Chinese)
[15] The National Standard Office. GB 2689.1-81.The General Principle of Constant Stress Life Test and Accel-erated Life Test[S]. Beijing: Standards Press of China,1981.(in Chinese)
[16] Wang Wujie, Liu Yongqiang, Zheng Bin. Research on Dewar heat leakage detecting technologies using infrared detectors[J]. Journal of Test and Measurem Engtechnology, 2008, 22(3): 222-224. (in Chinese)