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    Journals >Opto-Electronic Engineering >Volume 31 >Issue 6 >Page 30 > Article
    • Opto-Electronic Engineering
    • Vol. 31, Issue 6, 30 (2004)
    Study on a novel atomic force microscope with large scanning range
    [in Chinese] and [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese]. Study on a novel atomic force microscope with large scanning range[J]. Opto-Electronic Engineering, 2004, 31(6): 30 Copy Citation Text show less

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    [in Chinese], [in Chinese]. Study on a novel atomic force microscope with large scanning range[J]. Opto-Electronic Engineering, 2004, 31(6): 30
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