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    Journals >Chinese Optics Letters >Volume 7 >Issue 12 >Page 1109 > Article
    • Chinese Optics Letters
    • Vol. 7, Issue 12, 1109 (2009)
    Measurement of in-plane deformations of microsystems by digital holography and speckle interferometry
    Invited Paper
    Author Affiliations
  • G. Pedrini1*, J. Gaspar2, O. Paul2, and W. Osten1
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    DOI: 10.3788/COL20090712.1109 Cite this Article Set citation alerts
    Invited Paper, "Measurement of in-plane deformations of microsystems by digital holography and speckle interferometry," Chin. Opt. Lett. 7, 1109 (2009) Copy Citation Text show less
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    Article index updated: Jun. 2, 2024
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    The article is cited by 9 article(s) from Web of Science.
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    Invited Paper, "Measurement of in-plane deformations of microsystems by digital holography and speckle interferometry," Chin. Opt. Lett. 7, 1109 (2009)
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    Paper Information
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