• Journal of Inorganic Materials
  • Vol. 38, Issue 3, 316 (2023)
Xiaotu SHI1,2,3, Qingli ZHANG1,3,*, Guihua SUN1,3, Jianqiao LUO1,3..., Renqin DOU1,3, Xiaofei WANG1,3, Jinyun GAO1,3, Deming ZHNAG1,3, Jiandang LIU4,* and Bangjiao YE4|Show fewer author(s)
Author Affiliations
  • 11. The Key Laboratory of Photonic Devices and Materials of Anhui Province, Anhui Institute of Optics and Fine Mechanics, Hefei Institutes of Physical Science, Chinese Academy of Sciences, Hefei 230031, China
  • 22. Science Island Branch of Graduate School, University of Science and Technology of China, Hefei 230026, China
  • 33. Advanced Laser Technology Laboratory of Anhui Province, Hefei 230037, China
  • 44. State Key Laboratory of Particle Detection and Electronics, University of Science and Technology of China, Hefei 230026, China
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    DOI: 10.15541/jim20220364 Cite this Article
    Xiaotu SHI, Qingli ZHANG, Guihua SUN, Jianqiao LUO, Renqin DOU, Xiaofei WANG, Jinyun GAO, Deming ZHNAG, Jiandang LIU, Bangjiao YE. Positron Annihilation Study of Yb:YAG Single Crystal Defects under Czochralski Method[J]. Journal of Inorganic Materials, 2023, 38(3): 316 Copy Citation Text show less
    XRD patterns of two groups of Yb:YAG crystals compared to the standard pattern (ICSD#20090)
    1. XRD patterns of two groups of Yb:YAG crystals compared to the standard pattern (ICSD#20090)
    X-ray rocking curves of two groups of Yb:YAG crystals
    2. X-ray rocking curves of two groups of Yb:YAG crystals
    Optical path diagram of double optical path transmittance measurement
    3. Optical path diagram of double optical path transmittance measurement
    Dislocation etching pits of Yb:YAG crystal at (111) crystalline face
    4. Dislocation etching pits of Yb:YAG crystal at (111) crystalline face
    Positron annihilation lifetime diagrams of each sample
    5. Positron annihilation lifetime diagrams of each sample
    Line-shape parameters of Doppler broadening spectra of Yb:YAG crystal samples under different processes
    6. Line-shape parameters of Doppler broadening spectra of Yb:YAG crystal samples under different processes
    AreaTransmittance/%Average value/%
    With scattering point83.3883.0083.2283.20
    Without scattering point84.0684.1784.2684.16
    Table 1. Optical transmittance of a sample syncroneously with and without scattering points
    Sampleτ1/ps I1/% τ2/ns I2/% τav/ps
    1-1165.7298.802.0371.198186.97
    1-2167.2698.952.0431.051188.14
    2-1161.42100.00//161.42
    2-2165.24100.00//165.24
    2-3162.90100.00//162.90
    2-4164.40100.00//164.40
    Table 2. Positron annihilation lifetime results of each sample
    Xiaotu SHI, Qingli ZHANG, Guihua SUN, Jianqiao LUO, Renqin DOU, Xiaofei WANG, Jinyun GAO, Deming ZHNAG, Jiandang LIU, Bangjiao YE. Positron Annihilation Study of Yb:YAG Single Crystal Defects under Czochralski Method[J]. Journal of Inorganic Materials, 2023, 38(3): 316
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