Correction Methods of Temperature Drift for Infrared Spectral Emissivity Measurement System

[1] Hanssen L M, Mekhontsev S N, Zeng J, et al. International Journal of Thermophysics, 2008, 29(1): 352.

[2] Cagran C P, Hanssen L M, Noorma M, et al. International Journal of Thermophysics, 2007, 28(2): 581.

[3] Dai J M, Fan Y, Sun X G, et al. International Journal of Thermophysics, 2002, 23(5): 1401.

[4] Righini F, Spisiak J, Bussolino G, et al. International Journal of Thermophysics, 1999, 20(4): 1095.

[5] Setién-Fernándeza I, Echániza T, González-Fernándeza L, et al. Solar Energy Materials and Solar Cells, 2013, 117: 390.

[6] Feng G, Li Y, Wang Y, et al. Optics Letters, 2012, 37(3): 299.

[7] Gatebe C K, Butler J, Cooper J W. Applied Optics, 2007, 46(31): 7640.

[8] Kurosawa R, Inoue T, Baba Y, et al. Measurement Science and Technology, 2301, 24(1): 015603.

[9] Shi D, Liu Q, Zhu Z, et al. Infrared Physics & Technology, 2014, 64: 119.

[10] Tang H, Sun Q, Yi C G, et al. Journal of Materials Science, 2012, 47(5): 2162.

[11] Imaz E, Alonso R, Heras C, et al. IEEE Transactions on Industrial Electronics, 2013, 61(5): 2622.

[12] Shi D, Liu Q, Zhu Z, et al. International Journal of Thermophysics, 2014, 35(8): 1545.

[13] Eppeldauer G, Graner J, Schanda J. Applied Optics, 1977, 16(1): 255.

[14] Park C H, Jeong I S, Kim J H, et al. Applied Physics Letters, 2003, 82(22): 3973.

[15] Larason T C, Bruce S S, Cromer C L, et al. Journal of Research-National Institute of Standards and Technology, 1996, 101: 133.