• Opto-Electronic Engineering
  • Vol. 42, Issue 1, 20 (2015)
WU Delin*, WU Zhiqiang, MA Botao, SU Yong, and MA Zhiyuan
Author Affiliations
  • [in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2015.01.004 Cite this Article
    WU Delin, WU Zhiqiang, MA Botao, SU Yong, MA Zhiyuan. The Research of Data Compensation Method for V-prism Test of High Refractive Index[J]. Opto-Electronic Engineering, 2015, 42(1): 20 Copy Citation Text show less
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    [2] SUN Guilin. The Systematic Analysis for Test Deviation of Glass Refractive Index by V-prism Method [J]. The Brief of the Xi′an Institute of Technology,1985(1):12-16.

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    [4] The State Department for Making Standard GB7962.11-2010. The measurement Methods for Colorless Optical Glass:The Accurate measurement Method for Refractive Index [S]. 2010.

    [5] SHEN Hailong,YANG Guanming. The Analysis for V-prism Instrument Testing Deviation and How to Apply it Correctly [J]. The Technology of Yunnan Optics,1991(2):13-18.

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    [8] MA Botao,PEI Chunyan,LI Xiaochun. Modified Formula of Environmental Conditions in Precision Measurement of Optical Glass Refractive Index [J]. Journal of Applied Optics,2012,33(5):936-939.

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    WU Delin, WU Zhiqiang, MA Botao, SU Yong, MA Zhiyuan. The Research of Data Compensation Method for V-prism Test of High Refractive Index[J]. Opto-Electronic Engineering, 2015, 42(1): 20
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