• Laser & Optoelectronics Progress
  • Vol. 55, Issue 8, 81008 (2018)
Shi Xun1, Ren Jie2, Ren Xiaokang1, Ren Jinjun1, and Yuan Zhifeng1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop55.081008 Cite this Article Set citation alerts
    Shi Xun, Ren Jie, Ren Xiaokang, Ren Jinjun, Yuan Zhifeng. Drift Registration Based on Curvature Characteristics[J]. Laser & Optoelectronics Progress, 2018, 55(8): 81008 Copy Citation Text show less
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    Shi Xun, Ren Jie, Ren Xiaokang, Ren Jinjun, Yuan Zhifeng. Drift Registration Based on Curvature Characteristics[J]. Laser & Optoelectronics Progress, 2018, 55(8): 81008
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