Fuzhen Huang, Tianci Wang. Lightweight GCP-YOLOv8s for Insulator Defect Detection[J]. Laser & Optoelectronics Progress, 2025, 62(2): 0212004
- Laser & Optoelectronics Progress
- Vol. 62, Issue 2, 0212004 (2025)
Fig. 1. Structure of YOLOv8s network
Fig. 2. Structure of GSConv network
Fig. 3. Structure of C2f network and Bottleneck
Fig. 4. Structure of C2f-Faster network
Fig. 5. PConv working principle and FasterNet structure
Fig. 6. Structure of CF-EMA network
Fig. 7. Feature fusion structure after adding small defect detection layer. (a) Default path of YOLOv8s; (b) after adjusting
Fig. 8. Structure of GCP-YOLOv8s network
Fig. 9. Aerial images of partial insulators. (a) Display of defects; (b) examples of data enhancement; (c) fogging effect under different fog thickness (L: brightness, D: fog thickness)
Fig. 10. Information visualization of insulator defect dataset. (a) Category and quantity; (b) distribution of central points; (c) defect size distribution
Fig. 11. Comparison of mAP@0.5 of GCP-YOLOv8s and YOLOv8s
Fig. 12. Comparison of mAP@0.5 of each model
Fig. 13. Detection effect of YOLOv8s and GCP-YOLOv8s in different backgrounds
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Table 1. Experimental parameters
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Table 2. GCP-YOLOv8s ablation experiment
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Table 3. Comparative experiment among GCP-YOLOv8s and other algorithms
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