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    Journals >Opto-Electronic Engineering >Volume 29 >Issue 2 >Page 24 > Article
    • Opto-Electronic Engineering
    • Vol. 29, Issue 2, 24 (2002)
    An Automatic Measurement System for LuminanceDistribution of Color Kinescope Electron Beam
    1, 2, 1, and 3
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Automatic Measurement System for LuminanceDistribution of Color Kinescope Electron Beam[J]. Opto-Electronic Engineering, 2002, 29(2): 24 Copy Citation Text show less
    References

    [2] Onozawa S, Mikoshiba S, Shirai S, et al. Shaping of an electron beam in high-resolution CRTs for reduction of moiré fringes[A]. Proceedings of the 5th Asian Symposium on Information Display[C]. [s.l]:[s.n.],1999.193-196.

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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. An Automatic Measurement System for LuminanceDistribution of Color Kinescope Electron Beam[J]. Opto-Electronic Engineering, 2002, 29(2): 24
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