• Chinese Journal of Quantum Electronics
  • Vol. 29, Issue 2, 236 (2012)
Ze-ling GE1,2,* and Yong-lin ZHENG1,3
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3969/j.issn.1007-5461. 2012.02.017 Cite this Article
    GE Ze-ling, ZHENG Yong-lin. Analysis of dielectric constant on a material surface for granular film[J]. Chinese Journal of Quantum Electronics, 2012, 29(2): 236 Copy Citation Text show less
    References

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    [10] Iwamoto M, Mizutani Y, Sugimura A. Analysis of dielectric relaxation time of organic monolayer films on a material surface [J]. Phys. Rev., 1996, B54: 8186-8191.

    [11] Iwamoto M, Wu C X, Sugimura A. Analysis of thermally stimulated Maxwell-displacement current across organic monolayers [J]. Phys. Rev., 1996, E52: 6392-6397.

    [12] Iwamoto M, Sugimura A, Ou-Yang Z. Determination of dielectric relaxation time of Langmuir-films by a whole-curve method using the Maxwell displacement current [J]. Phys. Rev., 1997, E54: 6537-6542.

    [13] Sugimura A, Iwamoto M, Ou-Yang Z. Phase transition of molecular orientation at the liquid-air interface [J]. Phys. Rev. E, 1994, 50: 614.

    GE Ze-ling, ZHENG Yong-lin. Analysis of dielectric constant on a material surface for granular film[J]. Chinese Journal of Quantum Electronics, 2012, 29(2): 236
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