Spatial resolution of surface plasmon interference microscopy

[in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 29 >Issue 4 >Page 32 > Article

Opto-Electronic Engineering
Vol. 29, Issue 4, 32 (2002)

Spatial resolution of surface plasmon interference microscopy

[in Chinese] and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese]. Spatial resolution of surface plasmon interference microscopy[J]. Opto-Electronic Engineering, 2002, 29(4): 32 Copy Citation Text

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References

[1] ROTHENHAUSLER B, Knoll W. Surface-plasmon microscopy [J]. Nature (London), 1988, 332 (6165): 615-617.

[2] GRIGORENKO A N, Nikitin P I, Kabashin A V. Phase jumps and interferometric surface plasmon resonance imaging [J]. Appl. Phys. Lett, 1999, 75 (25): 3917-3919.

[3] NOTOCOVICH A G, ZHUK V, LIPSON S G. Surface plasmon resonance phase imaging [J]. Appl. Phys. Lett, 2000, 76 (13):1665-1667.

[4] MATSUBARA K, KAWATA S, MINAMI S. Optical chemical sensor based on surface plasmon measurement [J]. Appl. Opt, 1988, 27 (6):1160-1163.

[5] KOLOMENSKII A A, GERSHON P D, SCHUESSLER H A. Sensitivity and detection limit of concentration and adsorption measurements by laser-induced surface-plasmon resonance [J]. Appl. Opt, 1997, 36 (25): 6539-6546.

[6] KROO N, KRIEGER W, LENKEFI Z, et al. A new optical method for investigation of thin metal films [J]. Surf. Sci, 1995, 331 -333(Part B): 1305-1309.

[in Chinese], [in Chinese]. Spatial resolution of surface plasmon interference microscopy[J]. Opto-Electronic Engineering, 2002, 29(4): 32

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