• Acta Optica Sinica
  • Vol. 36, Issue 12, 1214004 (2016)
Gao Liuzheng*, Zhao Minwei, Zhang Wei, and Li Ying
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/aos201636.1214004 Cite this Article Set citation alerts
    Gao Liuzheng, Zhao Minwei, Zhang Wei, Li Ying. Light Field on Silicon Substrate of Charge Coupled Device[J]. Acta Optica Sinica, 2016, 36(12): 1214004 Copy Citation Text show less
    References

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    [2] Liu Yi, Zhou Qing, Yin Dayi. Analysis andsolution of two-phase FT-CCD charge overflow phenomenon[J]. Laser & Optoelectronics Progress, 2014, 51(8): 080401.

    [3] Li Z W, Wang X, Shen Z H, et al. Mechanisms for the millisecond laser-induced functional damage to silicon charge-coupled imaging sensors[J]. Applied Optics, 2015, 54(3): 378-388.

    [4] Li M X, Jin G Y, Tan Y, et al. Study on the mechanism of a charge-coupled device detector irradiated by millisecond pulse laser under functional loss[J]. Applied Optics, 2016, 55(6): 1257-1261.

    [5] Ni Xiaowu, Lu Jian, He Anzhi. Measurement of laser damaging thresholds of CCD devices[J]. Laser Technology, 1994, 18(3): 153-156.

    [6] Shen Hongbin, Shen Xueju, Zhou Bing, et al. Experimental study of 532 nm pulsed laser irradiating CCD[J]. High Power Laser and Particle Beams, 2009, 21(10): 1449-1454.

    [7] Shao Junfeng, Liu Yang, Wang Tingfeng, et al. Damage effect of charge coupled device with multiple-pulse picosecond laser[J]. Acta Armamentarii, 2014, 35(9): 1408-1413.

    [8] Gao L Z, Zhu Z W, Shao Z Z, et al. Electric-induced oxide breakdown of a charge-coupled device under femtosecond laser irradiation[J]. Applied Optics, 2013, 52(31): 7524-7529.

    [9] Huang Shaoyan, Zhang Yongsheng, Tang Benqi, et al. Damage effect on CCD detector irradiated by 500 fs laser pulse[J]. High Power Laser and Particle Beams, 2005, 17(10): 1445-1448.

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    CLP Journals

    [1] Shao Junfeng, Guo Jin, Wang Tingfeng, Zheng Changbin. Damage accumulation effects of multiple laser pulses irradiated on charged coupled device[J]. Infrared and Laser Engineering, 2017, 46(10): 1003002

    Gao Liuzheng, Zhao Minwei, Zhang Wei, Li Ying. Light Field on Silicon Substrate of Charge Coupled Device[J]. Acta Optica Sinica, 2016, 36(12): 1214004
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