[1] Zhang C Z, Blarre L D, Walser R M, et al. Mechanism for laser-induced functional damage to silicon charge-coupled imaging sensor[J]. Applied Optics, 1993, 32(27): 5201-5210.
[3] Deng Min, Sun Li, Zhou Xiaoyan, et al. Research on lifetime testing and failure analysis of silicon avalanche photoelectric detectors[J]. Journal of Ordnance Equipment Engineering, 2016, 37(8): 160-163. (in Chinese)
[4] Bonse J, Baudach S, Krüger J, et al. Femtosecond laser ablation of silicon-modification thresholds and morphology[J]. Appl Phys A, 2002, 74(1): 19-25.
[9] Li Zhiming, Nie Jinsong, Hu Yuze, et al. Heat accumulation effects on the ablation of silicon with high frequency femtosecond laser[J]. Laser & Infrared, 2017, 47(4): 410-415. (in Chinese)
[10] Zhong Hairong, Liu Tianhua, Lu Qisheng. Review on the laser-include damage mechanism study of photoelectric detector[J]. High Power Laser and Particle Beams, 2000, 12(4): 423-428. (in Chinese)
[11] Shao Junfeng, Liu Yang, Wang Tingfeng, et al. Damage effect of charged coupled device with multiple-pulse picosecond laser [J]. Acta Armamentarii, 2014, 35(9): 1408-1413. (in Chinese)