• Chinese Optics Letters
  • Vol. 19, Issue 12, 123201 (2021)
Yi Jia1, Li Guo2、*, Shilin Hu3, Xinyan Jia1、**, Daihe Fan1, Ronghua Lu4, Shensheng Han4, and Jing Chen5、6、***
Author Affiliations
  • 1School of Physics, Southwest Jiaotong University, Chengdu 610031, China
  • 2Department of Physics, Shanghai Normal University, Shanghai 200234, China
  • 3Guangdong Provincial Key Laboratory of Quantum Metrology and Sensing & School of Physics and Astronomy, Sun Yat-sen University (Zhuhai Campus), Zhuhai 519082, China
  • 4Key Laboratory for Quantum Optics, Shanghai Institute of Optics and Fine Mechanics, Chinese Academy of Sciences, Shanghai 201800, China
  • 5Institute of Applied Physics and Computational Mathematics, Beijing 100088, China
  • 6Center for Advanced Material Diagnostic Technology, College of Engineering Physics, Shenzhen Technology University, Shenzhen 518118, China
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    DOI: 10.3788/COL202119.123201 Cite this Article Set citation alerts
    Yi Jia, Li Guo, Shilin Hu, Xinyan Jia, Daihe Fan, Ronghua Lu, Shensheng Han, Jing Chen. Time-energy analysis of the photoionization process in a double-XUV pulse combined with a few-cycle IR field[J]. Chinese Optics Letters, 2021, 19(12): 123201 Copy Citation Text show less

    Abstract

    We calculate the time-energy distribution (TED) and ionization time distribution (ITD) of photoelectrons emitted by a double-extreme-ultraviolet (XUV) pulse and a two-color XUV-IR pulse using the Wigner distribution-like function based on the strong field approximation. For a double-XUV pulse, besides two identical broad distributions generated by two XUV pulses, many interference fringes resulting from the interference between electrons generated, respectively, by two pulses appear in the TED. After adding an IR field, the TED intuitively exhibits the effect of the IR field on the electron dynamics. The ITDs during two XUV pulses are no longer the same and show the different changes for the different two-color fields, the origin of which is attributed to the change of the electric field induced by the IR field. Our analysis shows that the emission time of electrons ionized during two XUV pulses mainly depends on the electric field of the combined XUV pulse and IR pulse.
    Sfi=idtψAf(p,t)|VA|φi(t).

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    |ψAf(p,t)=1vexp{i[p+A(t)]·riSp(t)},

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    Sfi=ivdtp+A(t)|VA|φ0×exp[iSp(t)+iIpt]=12πdtSeip22t,

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    S=i2πvp+A(t)|VA|φ0×exp{it[p·A(τ)+A(τ)22]dτ+iIpt}.

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    f(t,p22,Θ)=1πS*(t+t,Θ)×S(tt,Θ)e2ip22tdt,

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    f(t,p22)dt=|Sfi|2p.

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    P(t)=f(t,p22)d(p22).

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    A(t)=AIR(t)+AXUV1(t)+AXUV2(t).

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    AIR(t)=EIRωsin2(πtτIR)cos(ωt+φIR)ex,0<t<τIR,

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    AXUVi(t)=EXUVΩsin2[π(ttCi+τXUV2)τXUV]×cos[Ω(ttCi+τXUV2)+φXUV]ex,tCiτXUV2<t<tCi+τXUV2,i=1,2.

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    [p0AIR(t0)]22p022p0·AIR(t0),

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    (p±2AIR0π)22=(2n+1)ω0.19UpIp,

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    Yi Jia, Li Guo, Shilin Hu, Xinyan Jia, Daihe Fan, Ronghua Lu, Shensheng Han, Jing Chen. Time-energy analysis of the photoionization process in a double-XUV pulse combined with a few-cycle IR field[J]. Chinese Optics Letters, 2021, 19(12): 123201
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