• Acta Optica Sinica
  • Vol. 23, Issue 12, 1507 (2003)
[in Chinese]*, [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Data Analysis of Optical Properties of Diamond Films by Infrared Spectroscopic Ellipsometry[J]. Acta Optica Sinica, 2003, 23(12): 1507 Copy Citation Text show less
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    [2] McMarr P J, Vedam K, Narayan J. Spectroscopic ellipsometry: a new tool for nondestructive depth profiling and characterization of interfaces. Appl. Phys. Lett., 1986, 59(3):694~701

    [3] Jellison G E. The calculation of thin film parameters from spectroscopic ellipsometry data. Thin Solid Films, 1990, 291(4):40~45

    [4] Comfort J C. Simulation model testing. Ex tended abst racts, Annual Simulation Symposium. New York: Society for Computer Simulation, 1987. 185~196

    [5] Fang Z J, Xia Y B. A new quantitative determination of stress by Raman spectroscopy in diamond grown on alumina. J. Phys.: Condensed Matter, 2002, 14(21):5271~5276

    [6] Palik E D. Handbook of Optical Constants of Solid. London: Academic Press, 1985. 104~108

    [7] Lorentz H A. Theory of Elect rons. 2nd edition. Teubner: Leipzig, 1916. 132~149

    [8] Bruggeman D A G. The calculation of various physical constant of heterogeneous substances. 1. The dielectric constant and conductivities of mixtures composed of isotropic substances. A nnual Phys., 1935, 5(24):636~791

    [9] Ferrieu F, Duarte D. Characterization of thin films and materials used in semiconductor technology by spectroscopic ellipsometry. Thin Solid Films, 1988, 164(1):43~50

    [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Data Analysis of Optical Properties of Diamond Films by Infrared Spectroscopic Ellipsometry[J]. Acta Optica Sinica, 2003, 23(12): 1507
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