• Laser & Optoelectronics Progress
  • Vol. 58, Issue 10, 1011019 (2021)
Mingyue Song1, Gaoliang Li2, Yuanjin Yu3, and Zhaohua Yang1、*
Author Affiliations
  • 1School of Instrumentation and Optoelectronic Engineering, Beihang University, Beijing 100191, China
  • 2Beijing Huahang Radio Measurement Institute, Beijing 100013, China
  • 3School of Automation, Beijing Institute of Technology, Beijing 100081, China
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    DOI: 10.3788/LOP202158.1011019 Cite this Article Set citation alerts
    Mingyue Song, Gaoliang Li, Yuanjin Yu, Zhaohua Yang. Research Review on Intensity Correlation Imaging in Scattering Media[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011019 Copy Citation Text show less

    Abstract

    Obtaining clear object images in the scattering media has an important application value in military counterterrorism, medical imaging, and ocean exploration. The essence of classic optical imaging is to directly record the first-order correlation imaging of the reflected light intensity of the object. However, as the mass concentration of the scattering media and the light transmission distance increase, the image quality declines rapidly and even imaging cannot be performed. Correlation imaging technology uses statistical properties of light field fluctuations to reconstruct images through coincidence measurement and second-order intensity correlation characteristics. The use of correlation imaging can reduce the environmental impact on imaging quality and provide a new imaging method for obtaining object images in scattering media. Therefore, the research results of intensity correlation imaging in scattering media at home and abroad in recent years are expounded from three aspects of various scattering media types, paths, and compensation reconstruction algorithms in this paper, and the application of intensity correlation imaging is summarized and prospected.
    Mingyue Song, Gaoliang Li, Yuanjin Yu, Zhaohua Yang. Research Review on Intensity Correlation Imaging in Scattering Media[J]. Laser & Optoelectronics Progress, 2021, 58(10): 1011019
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