• Laser & Optoelectronics Progress
  • Vol. 49, Issue 5, 51203 (2012)
Bian Wenbin1、2、*, Gao Sitian2, Lu Rongsheng1, and Shi Yushu2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop49.051203 Cite this Article Set citation alerts
    Bian Wenbin, Gao Sitian, Lu Rongsheng, Shi Yushu. Analysis of Optical Characters of Confocal Fabry-Pérot Interference Microscopy Probe[J]. Laser & Optoelectronics Progress, 2012, 49(5): 51203 Copy Citation Text show less
    References

    [1] A. Pfortner, J. Schwide. Dispersion error in white-light Linnik interferometers and its implications for evaluation procedures[J]. Appl. Opt., 2001, 40(34): 6223~6228

    [2] P. Pavlicek, J. Soubusta. Measurement of the influence of dispersion on white-light interferometry [J]. Appl. Opt., 2004, 43(4): 766~770

    [3] P. Groot, X. C. Lega. Signal modeling for low-coherence height-scanning interference microscopy [J]. Appl. Opt., 2004, 43(25): 4821~4830

    [4] Sun Sutao, Liu Jiqiao, Zhou Jun et al.. Confocal Fabry-Perot interferometer for frequency stabilization of laser [J]. Chinese J. Lasers, 2008, 35(7): 1005~1008

    [5] Gu Min. Principles of Three Dimensional Imaging in Confocal Microscopes [ M ] . Wang Guiy ing Trans.. Beijing: New Times Press, 2000, 14~78

    [6] Jiang Qin, Qiu Lirong, Zhao Weiqian et al.. Effect of point detector position in dual-axes confocal microscopy [J]. Laser & Optics Progress, 2010, 47(8): 081201

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    Bian Wenbin, Gao Sitian, Lu Rongsheng, Shi Yushu. Analysis of Optical Characters of Confocal Fabry-Pérot Interference Microscopy Probe[J]. Laser & Optoelectronics Progress, 2012, 49(5): 51203
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