• Chinese Journal of Lasers
  • Vol. 18, Issue 9, 668 (1991)
[in Chinese], [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of parameters of semiconductor lasers via operating in an external cavity[J]. Chinese Journal of Lasers, 1991, 18(9): 668 Copy Citation Text show less

    Abstract

    Measurement of P-I (power-current) curves of the semiconductor laser in an external cavity may lead to the determination of such diode parameters as the absorption coefficient a, the differential small signal gain coefficient dg/dI and the photon lifetime τ. As a result, a simple and easy method has been proposed to designate some important parameters of semiconductor lasers.
    [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Measurement of parameters of semiconductor lasers via operating in an external cavity[J]. Chinese Journal of Lasers, 1991, 18(9): 668
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