• Opto-Electronic Engineering
  • Vol. 43, Issue 6, 13 (2016)
GAO Huiting1、*, LIU Wei1, HE Hongyan1, and WU Mei2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2016.06.003 Cite this Article
    GAO Huiting, LIU Wei, HE Hongyan, WU Mei. Static PSF of TDI-CCD Measurement with Multi-phase-knife Method[J]. Opto-Electronic Engineering, 2016, 43(6): 13 Copy Citation Text show less
    References

    [4] Takacs P Z,Kotov I,Frank J,et al. PSF and MTF Measurement Method for Thick CCD Sensor Characterization [C]// High Energy,Optical,and Infrared Detectors for Astronomy IV,California,USA,June 27,2010,7742:7-12.

    [6] ZHANG Hua,SHI Yikai,HUANG Kuidong,et al. Point spread function modeling method for X-ray flat panel detector imaging

         [C]// 6th International Symposium on Advanced Optical Manufacturing and Testing Technologies:Optical Test and Measurement Technology and Equipment,Xiamen,China,April 26,2012,8417:1-6.

    [7] LIU Changmeng,CHEN Xi. Point Spread Function (PSF) Measurement for Cell Phone Camerawith a High Resolution PSF of the Imaging Lens and a Sub-pixel Digital Algorithm [C]// Optics and Photonics for Information Processing II,August 28, 2008,7072:1-12.

    GAO Huiting, LIU Wei, HE Hongyan, WU Mei. Static PSF of TDI-CCD Measurement with Multi-phase-knife Method[J]. Opto-Electronic Engineering, 2016, 43(6): 13
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