Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Acta Optica Sinica >Volume 36 >Issue 5 >Page 534001 > Article
    • Acta Optica Sinica
    • Vol. 36, Issue 5, 534001 (2016)
    A Technology of X-Ray Imaging Flat-Response Low-Pass Filter
    Yuan Zheng1、*, Cao Zhurong1, Zhu Xiaoli2, Deng Bo1, Li Jin1, Yang Zhiwen1, Hong Caihao3, Liu Shenye1, Yang Jiamin1, and Zhao Yidong3
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
    • show less
    DOI: 10.3788/aos201636.0534001 Cite this Article Set citation alerts
    Yuan Zheng, Cao Zhurong, Zhu Xiaoli, Deng Bo, Li Jin, Yang Zhiwen, Hong Caihao, Liu Shenye, Yang Jiamin, Zhao Yidong. A Technology of X-Ray Imaging Flat-Response Low-Pass Filter[J]. Acta Optica Sinica, 2016, 36(5): 534001 Copy Citation Text show less
    Cited By
    Article index updated: May. 21, 2024
    Citation counts are provided from Researching.
    The article is cited by 2 article(s) from Researching.
    Abstract
    Get PDF(in Chinese)
    Figures&Tables (0)
    Equations (0)
    References (15)
    Cited By (2)
    Get Citation
    Copy Citation Text
    Yuan Zheng, Cao Zhurong, Zhu Xiaoli, Deng Bo, Li Jin, Yang Zhiwen, Hong Caihao, Liu Shenye, Yang Jiamin, Zhao Yidong. A Technology of X-Ray Imaging Flat-Response Low-Pass Filter[J]. Acta Optica Sinica, 2016, 36(5): 534001
    Download Citation
    Set citation alerts for the article
    Tools
    Share
    Set citation alerts for the article
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology