• Acta Optica Sinica
  • Vol. 22, Issue 11, 1291 (2002)
[in Chinese]1、*, [in Chinese]2, and [in Chinese]1
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  • 1[in Chinese]
  • 2[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Influences of Substrate Temperature and Annealing on Optical Properties and Carrier Concentration of CdIn2O4 Thin Films[J]. Acta Optica Sinica, 2002, 22(11): 1291 Copy Citation Text show less
    References

    [1] Shannon R D, Gillson J L, Bouchard R J. Single crystal systhesis and electrical properties of CdSnO3, Cd2SnO4, In2TeO6 and CdIn2O4. J. Phys. Chem. Solids, 1977, 38(8):877~881

    [2] Haacke G. Materials for transparent heat mirror coatings. In: Lampert C M eds., Optical Coatings for Energy Efficiency and Solar Applications. Proc. Soc. Photo-Opt. Instrum. Engng., 1982, 324:10~15

    [3] Budzynska K, Leja E, Skrzypek S. Transparent conductive CdIn2O4 thin films prepared by dc reactive sputtering. Sol. Energy Mater., 1985, 12(1):57~68

    [4] Labeau M, Reboux V, Dhahri D et al.. New mixed oxide as thin film transparent electrodes spinel phase CdIn2O4. Thin Solid Films, 1986, 136(2):257~262

    [5] Wu X, Coutts T J, Mulligan W P. Properties of transparent conducting oxides formed from CdO and ZnO alloyed with SnO2 and In2O3. J. Vac. Sci. Technol. (A), 1997, 15(3):1057~1062

    [8] Chu X, Liu X, Meng G. Preparation and gas-sensing properties of nano-CdIn2O4 material. Mater. Res. Bull., 1999, 34(5):693~700

    [9] Rakic D. Algorithm for the determination of intrinsic optical constants of metal films: application to aluminum. Appl. Opt., 1995, 34(22):4755~4767

    [10] Markovic M I, Rakic A D. Determination of optical properties of aluminum including electron reradiation in the Lorentz-Drude model. Opt. Laser Technol., 1990, 22(6):394~398

    [11] Burstein E. Anomalous optical absorption limit in InSb. Phys. Rev., 1954, 93(3):632~633

    [in Chinese], [in Chinese], [in Chinese]. Influences of Substrate Temperature and Annealing on Optical Properties and Carrier Concentration of CdIn2O4 Thin Films[J]. Acta Optica Sinica, 2002, 22(11): 1291
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