Analysis of the influencing factors on subpixel Sobel-Zernike moments edge operator

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 32 >Issue 7 >Page 71 > Article

Opto-Electronic Engineering
Vol. 32, Issue 7, 71 (2005)

Analysis of the influencing factors on subpixel Sobel-Zernike moments edge operator

¹, ², ³, ¹, and ¹

Author Affiliations

¹[in Chinese]

²[in Chinese]

³[in Chinese]

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DOI: Cite this Article

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Analysis of the influencing factors on subpixel Sobel-Zernike moments edge operator[J]. Opto-Electronic Engineering, 2005, 32(7): 71 Copy Citation Text

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References

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[2] Edward P. LYVERS,Owen Robert MITCHELL,Mark L. AKEY,et al. Subpixel measurements using a moment-based-edge operator [J]. IEEE Transactions on Pattern analysis and Machine Intelligence,1995,11(12):1293-1309.

[3] Sugata GHOSAL,Rajiv MEHROTRA. Orthogonal moment operators for subpixel edge detection[J]. Pattern Recognition,1993,26(2):295-306.

[4] Simon X. LIAO,Miroslaw PAWLAK. On image analysis by moments [J]. IEEE Transactions on Pattern analysis and Machine Intelligence,1996,18(3):254-266.