• Acta Photonica Sinica
  • Vol. 47, Issue 5, 512001 (2018)
LI Chen*, ZHANG Xu, and TU Da-wei
Author Affiliations
  • [in Chinese]
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    DOI: 10.3788/gzxb20184705.0512001 Cite this Article
    LI Chen, ZHANG Xu, TU Da-wei. Deflectometry Measurement Based on Line-plane Model[J]. Acta Photonica Sinica, 2018, 47(5): 512001 Copy Citation Text show less
    References

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    LI Chen, ZHANG Xu, TU Da-wei. Deflectometry Measurement Based on Line-plane Model[J]. Acta Photonica Sinica, 2018, 47(5): 512001
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