• High Power Laser and Particle Beams
  • Vol. 34, Issue 9, 095013 (2022)
Yayun Dong, Zhitong Cui, Yinhui Cheng, Feng Qin, and Xin Nie
Author Affiliations
  • State Key Laboratory of Intense Pulsed Radiation Simulation and Effect, Northwest Institute of Nuclear Technology, Xi’an 710024, China
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    DOI: 10.11884/HPLPB202234.210565 Cite this Article
    Yayun Dong, Zhitong Cui, Yinhui Cheng, Feng Qin, Xin Nie. Circuit modeling and analysis of kA level pulse current injection probe[J]. High Power Laser and Particle Beams, 2022, 34(9): 095013 Copy Citation Text show less
    Typical test setting of PCI
    Fig. 1. Typical test setting of PCI
    Model of the integrated circuit of PCI test platform
    Fig. 2. Model of the integrated circuit of PCI test platform
    Schematic diagram of current injection probe structure
    Fig. 3. Schematic diagram of current injection probe structure
    Model of the integrated circuit of current injection probe
    Fig. 4. Model of the integrated circuit of current injection probe
    Input impedance comparison of current injection probe between test and simulation
    Fig. 5. Input impedance comparison of current injection probe between test and simulation
    Frequency domain verification
    Fig. 6. Frequency domain verification
    Time domain verification
    Fig. 7. Time domain verification
    Simulation results
    Fig. 8. Simulation results
    Yayun Dong, Zhitong Cui, Yinhui Cheng, Feng Qin, Xin Nie. Circuit modeling and analysis of kA level pulse current injection probe[J]. High Power Laser and Particle Beams, 2022, 34(9): 095013
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