• Spectroscopy and Spectral Analysis
  • Vol. 42, Issue 6, 1666 (2022)
Spectral intensity and coverage band comparison of different sources
Fig. 1. Spectral intensity and coverage band comparison of different sources
Photosignal and frequency of LDLS
Fig. 2. Photosignal and frequency of LDLS
Optical path of near-infrared Fourier transform spectrometer
Fig. 3. Optical path of near-infrared Fourier transform spectrometer
Near-infrared Fourier transform spectrometer system(a): Light source high-frequency modulated by using chopper; (b): LDLS system
Fig. 4. Near-infrared Fourier transform spectrometer system
(a): Light source high-frequency modulated by using chopper; (b): LDLS system
Detector background noise without light signal input
Fig. 5. Detector background noise without light signal input
The spectral comparison results with different integration times of the lock-in amplifier(a): Integration time=20 ms; (b): Integration time=10 ms; (c): Integration time=5 ms;(d): Integration time=1 ms; (e): Integration time=0.5 ms; (f): SNRI vs integration time
Fig. 6. The spectral comparison results with different integration times of the lock-in amplifier
(a): Integration time=20 ms; (b): Integration time=10 ms; (c): Integration time=5 ms;(d): Integration time=1 ms; (e): Integration time=0.5 ms; (f): SNRI vs integration time
Fourier transform interference spectral results with LDLS(a): Without demodulation; (b): With demodulation
Fig. 7. Fourier transform interference spectral results with LDLS
(a): Without demodulation; (b): With demodulation
Spectral SNRI before and after replacing the light source
Fig. 8. Spectral SNRI before and after replacing the light source
The near-infrared standard sample absorption spectra measured with LDLS Fourier transform spectral system(a): Fourier transformation spectra with and without standard sample; (b): near-infrared Fourier transformation spectra with background removed
Fig. 9. The near-infrared standard sample absorption spectra measured with LDLS Fourier transform spectral system
(a): Fourier transformation spectra with and without standard sample; (b): near-infrared Fourier transformation spectra with background removed
NameMain ParametersProduct ModelManufacturers
LDLSRadiance>40 mW·mm-2·sr·nm
λ=170~2 100 nm
EQ77Energetiq
He-Ne LaserP=21 mW
λ=632.8 nm
22037146/1145PEdmund
Lock-in amplifierSample Rate210 MSa·s-1
The frequency of work 0.7 μHz~50 MHz
HF2LIZurich Instruments
Halogen tungsten light sourceλ=360~2600 nm
P>10 mW
SLS201L/MThorlabs
ChopperChopper frequency 10 kHzMC1F10HPThorlabs
InGaAs Photodectorλ=900~2 570 nmPDA10DT-ECThorlabs
Position sensing detectorλ=400~1 050 nmPDQ30CThorlabs
Off-axis mirrorf=100 mmMPD249-M01Thorlabs
Data acquisition cardSample Rate 3.57 MSa·s-1PCIe-6374NI
Table 1. The equipment and model required for the experiment
Serial
number
Peak
/nm
Bandwidth
/nm
Peak
/nm
Bandwidth
/nm
11 070.221 068.35
21 220.321 220.55
31 363.721 362.95
41 464.721 464.65
51 524.021 524.05
61 938.421 939.05
Table 2. Near-infrared peak and bandwidth of standard sample
Standard
peaks 1/nm
Standard
peaks 2/nm
Test peaks
/nm
1 070.21 068.31 068.5
1 220.31 220.51 220.4
1 363.71 362.91 363.3
1 464.71 464.61 464.8
1 524.01 524.01 523.9
1 938.41 939.01 938.7
Table 3. Comparison of standard peaks and test peaks