Researching

Journals
  • Advanced Photonics
  • Photonics Insights
  • Advanced Photonics Nexus
  • Photonics Research
  • Advanced Imaging
  • View All Journals
  • Chinese Optics Letters
  • High Power Laser Science and Engineering
    • Articles
  • Optics
  • Physics
  • Geography
  • View All Subjects
    • Conferences
  • CIOP
  • HPLSE
  • AP
  • View All Events
    • News
    About CLP
    Search by keywords or author
    Journals >Spectroscopy and Spectral Analysis >Volume 30 >Issue 2 >Page 348 > Article
    • Spectroscopy and Spectral Analysis
    • Vol. 30, Issue 2, 348 (2010)
    Analysis and Estimate of Corn CNCPS Component by Near Infrared Reflectance (NIR) Spectroscopy
    YANG Fang1, XIE Cheng-wei2, LIU Da-sen1、3、*, Yu Peiqiang4, and LI Zhong-yu1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
  • 4Department of Animal and Poultry Science, University of Saskatchewan, 51 Campus Drive, Saskatoon, SK, Canada, S7N 5A8
    • show less
    DOI: Cite this Article
    YANG Fang, XIE Cheng-wei, LIU Da-sen, Yu Peiqiang, LI Zhong-yu. Analysis and Estimate of Corn CNCPS Component by Near Infrared Reflectance (NIR) Spectroscopy[J]. Spectroscopy and Spectral Analysis, 2010, 30(2): 348 Copy Citation Text show less
    References

    [4] Bouveresse E, Hartmann C, Massart D L. Analytical Chemistry, 1996, 68(6): 982.

    [5] Orman B A, Schumann Jr R A. Journal of Agricultural and Food Chemistry, 1991, 39: 883.

    Abstract
    Get PDF
    Figures&Tables (0)
    Equations (0)
    References (2)
    Get Citation
    Copy Citation Text
    YANG Fang, XIE Cheng-wei, LIU Da-sen, Yu Peiqiang, LI Zhong-yu. Analysis and Estimate of Corn CNCPS Component by Near Infrared Reflectance (NIR) Spectroscopy[J]. Spectroscopy and Spectral Analysis, 2010, 30(2): 348
    Download Citation
    Tools
    Share
    Save the article for my favorites
    Paper Information
    Recommended Topics
    laser devices and laser physics
    Lasers and Laser Optics
    Laser physics
    laser manufacturing
    Instrumentation, Measurement and Metrology