Zheng Cheng, Min Zhu, Yunan Liu, Zeya Huang, Wei Wang, Zhiqiang Shao. Determination of High-Temperature Refractive Index of Sapphire by Laser Displacement Measurement and Theoretical Research[J]. Acta Optica Sinica, 2023, 43(9): 0916003
- Acta Optica Sinica
- Vol. 43, Issue 9, 0916003 (2023)
Fig. 1. Parallel plate imaging principle
Fig. 2. Schematic diagram of optical path
Fig. 3. Test principle of laser displacement method. (a) Path of laser displacement; (b) position relation among laser spot, sapphire and CMOS camera
Fig. 4. Lattice parameters and model. (a) Schematic diagram of cell parameters of α-Al2O3 varying with temperature; (b) schematic diagram of crystal model of α-Al2O3 for theoretical calculation
Fig. 5.
Fig. 6. Relationship between measured refractive index and temperature. (a) Relationship between measured no of sapphire and temperature; (b) relationship between measured ne of sapphire and temperature
Fig. 7. Complex refractive index of α-Al2O3 varying with temperature. (a) [100] crystal orientation; (b) [001] crystal orientation
Fig. 8. Relationship between simulated refractive index of sapphire and temperature
Fig. 9. Point K path graph in Brillouin zone
Fig. 10. Simulation results of band structure of α-Al2O3. (a) Band structure of α-Al2O3 crystal; (b) relationship between band gap and temperature
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Table 1. Parameters of sapphire experimental sample
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Table 2. Birefringence of α-Al2O3 at wavelength of 445 nm under different temperatures
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Table 3. Real part of dielectric function of α-Al2O3 at wavelength of 445 nm under different temperatures
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