Research on the Interferogram Processing

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Acta Optica Sinica >Volume 19 >Issue 1 >Page 45 > Article

Acta Optica Sinica
Vol. 19, Issue 1, 45 (1999)

Research on the Interferogram Processing

[in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Research on the Interferogram Processing[J]. Acta Optica Sinica, 1999, 19(1): 45 Copy Citation Text

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References

[1] Enxi Yu, Soyoung S. Cha. Two-dimensional nonlinear regression for interferogram analysis. Proc. SPIE, 1995, 2546:297～306

[2] James S. Slepicka, Soyoung S. Cha. Stabilized nonlinear regression for interferogram analysis. Appl. Opt., 1995, 34(8):5039～5046

[3] Wonjong Joo, Soyoung S. Cha. Automated interferogram analysis based on an integrated expert system. Appl. Opt., 1995, 34(11):7486～7496

[4] Thomas M. Kreis. Computer aided evaluation of fringe patterns. Optics and Lasers in Engineering, 1993, (19):221～240

[5] Huang Zhi, Rolf B. Johansson. Interpretation and classification of fringe patterns. Optics and Lasers in Engineering, 1992, (17):9～25

[in Chinese], [in Chinese], [in Chinese], [in Chinese]. Research on the Interferogram Processing[J]. Acta Optica Sinica, 1999, 19(1): 45

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