Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
metasurface
laser
polarization
nir
lithium niobate
optical coherence tomography
Journals >
Acta Optica Sinica >
Volume 32 >
Issue 8 >
Page 828001 > Article
Acta Optica Sinica
Vol. 32, Issue 8, 828001 (2012)
Angle-Doppler Resolved Reflective Tomography Laser Imaging Radar
Jin Xiaofeng
*
, Yan Yi, Sun Jianfeng, Wu Yapeng, Zhou Yu, and Liu Liren
Author Affiliations
[in Chinese]
show less
DOI:
10.3788/aos201232.0828001
Cite this Article
Set citation alerts
Jin Xiaofeng, Yan Yi, Sun Jianfeng, Wu Yapeng, Zhou Yu, Liu Liren. Angle-Doppler Resolved Reflective Tomography Laser Imaging Radar[J]. Acta Optica Sinica, 2012, 32(8): 828001
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: May. 19, 2024
Citation counts are provided from Researching.
The article is cited by
4
article(s) from Researching.
Abstract
Get PDF(in Chinese)
Figures&Tables (0)
Equations (0)
References (21)
Cited By (4)
Get Citation
Copy Citation Text
Jin Xiaofeng, Yan Yi, Sun Jianfeng, Wu Yapeng, Zhou Yu, Liu Liren. Angle-Doppler Resolved Reflective Tomography Laser Imaging Radar[J]. Acta Optica Sinica, 2012, 32(8): 828001
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Remote Sensing and Sensors
Received: Feb. 5, 2012
Accepted: --
Published Online: --
The Author Email: Xiaofeng Jin (jxf2008@siom.ac.cn)
DOI:
10.3788/aos201232.0828001
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm