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    Journals >Opto-Electronic Engineering >Volume 32 >Issue 12 >Page 51 > Article
    • Opto-Electronic Engineering
    • Vol. 32, Issue 12, 51 (2005)
    Influence of defocus on automatic focusing evaluation function
    [in Chinese]1、2, [in Chinese]1、2, and [in Chinese]1
    Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. Influence of defocus on automatic focusing evaluation function[J]. Opto-Electronic Engineering, 2005, 32(12): 51 Copy Citation Text show less
    References

    [2] Wolfgang KESSELER,Jan FISCHER.Analytical model of autofocus system with CCD camera[J].SPIE,2000,3965:369-380.

    [3] Ovidiu GHITA,Paul F.WHELAN.A bin picking system based on depth from defocus[J].Machine Vision and Applications,2003,(13):234-244.

    [4] Ng Kuang Chern.NATHANIEL,Poo Aun NEOW,Marcelo H.ANG JR.Practical Issues in Pixel-based Autofocusing for Machine Vision[A].Proceedings of the 2001 IEEE:International Conference on Robotics & Automation[C].Seoul:IEEE,2001.2791-2796.

    [5] A.SANTOS,C.ORTIZ DE SOLóRZANO,J.J.VAQUERO,et al.Evaluation of autofocus functions in molecular cytogenetic analysis[J].Journal of Microscopy,1997,188(3):264-273.

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    [in Chinese], [in Chinese], [in Chinese]. Influence of defocus on automatic focusing evaluation function[J]. Opto-Electronic Engineering, 2005, 32(12): 51
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