• Acta Optica Sinica
  • Vol. 17, Issue 2, 200 (1997)
[in Chinese]1, [in Chinese]2, and [in Chinese]3
Author Affiliations
  • 1Department of Mechanical Engineering, Oakland University, Rochester, Michigan 48309
  • 2[in Chinese]
  • 3[in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Phase Shift and Carrier Techniques of Shear Beam ESPI for Static and Dynamic In-Plane Displancement Measurement[J]. Acta Optica Sinica, 1997, 17(2): 200 Copy Citation Text show less

    Abstract

    Novel phase shift and carrier techniques for measurement of in-place displacement field are proposed. In shear beam ESPI (Electronic Speckle Interferometry) the illumination beam is split into two wave fronts by a prism. Laterally movements of the prism introduce phase shifts. A small angle wedge is set behind the prism. A rotation of the wedge produces carrier fringes. The movement of the prism or the wedge can be controlled precisely be mechanical or electrical mechanism. digital image processing algorithms, phase iteration and FTM (Fourier Transform Method), are used to extract defoemation information. Theores and thier experimental demonstrations are presented.
    [in Chinese], [in Chinese], [in Chinese]. Phase Shift and Carrier Techniques of Shear Beam ESPI for Static and Dynamic In-Plane Displancement Measurement[J]. Acta Optica Sinica, 1997, 17(2): 200
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