• Opto-Electronic Engineering
  • Vol. 38, Issue 12, 69 (2011)
ZHANG Jian-feng1、2、*, CAO Xue-dong1, JING Hong-wei1, WU Shi-bin1, and YIN Xu1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3969/j.issn.1003-501x.2011.12.013 Cite this Article
    ZHANG Jian-feng, CAO Xue-dong, JING Hong-wei, WU Shi-bin, YIN Xu. Rotation Method for System Error Calibration of Interferometer[J]. Opto-Electronic Engineering, 2011, 38(12): 69 Copy Citation Text show less
    References

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    [7] XU Chen, CHEN Lei, YI Jia-yi. Method for absolute flatness measurement of optical surfaces [J]. Applied Optics(S1539-4522), 2009, 48(13): 2536-2541.

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    [10] Otaki K, Yamamoto T, Fukuda Y, et al. Accuracy evaluation of the point diffraction interferometer for extreme ultraviolet lithography aspheric mirror [J]. J.Vav.Sci.Technol(S1520-8567), 2002, 20(1): 295-300.

    [13] VINCENZO Greco, RICCARDO Tronconi, CIRO Del Veuhio, et al. Absolute Calibration of an Optical Flat [J]. Applied Optics(S1539-4522), 1999, 38(10): 2018-2027.

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    ZHANG Jian-feng, CAO Xue-dong, JING Hong-wei, WU Shi-bin, YIN Xu. Rotation Method for System Error Calibration of Interferometer[J]. Opto-Electronic Engineering, 2011, 38(12): 69
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