• Infrared and Laser Engineering
  • Vol. 52, Issue 12, 20230310 (2023)
Xin Li1,2, Zhengyi Lv3, Bolun Cui1,2, Jiaming Zhang1..., Ziying Liu1, Xun Huang1 and Tianzhuo Zhao4,5,*|Show fewer author(s)
Author Affiliations
  • 1Beijing Institute of Space Mechanics and Electricity, Beijing 100094, China
  • 2Beijing Aviation Intelligent Remote Sensing Equipment Engineering Technology Research Center, Beijing 100094, China
  • 3Aerospace Dongfanghong Satellite Co. Ltd., Beijing 100094, China
  • 4University of Chinese Academy of Sciences, Beijing 100049, China
  • 5Aerospace Information Research Institute, Chinese Academy of Sciences, Beijing 100094, China
  • show less
    DOI: 10.3788/IRLA20230310 Cite this Article
    Xin Li, Zhengyi Lv, Bolun Cui, Jiaming Zhang, Ziying Liu, Xun Huang, Tianzhuo Zhao. Quantitative analysis of coaxial zoom laser-induced breakdown spectroscopy[J]. Infrared and Laser Engineering, 2023, 52(12): 20230310 Copy Citation Text show less
    Flowchart of zoom-LIBS correction and quantitative analysis
    Fig. 1. Flowchart of zoom-LIBS correction and quantitative analysis
    Schematic of zoom-LIBS equipment
    Fig. 2. Schematic of zoom-LIBS equipment
    Estimated electron density using Stark broadening of 308.22 nm
    Fig. 3. Estimated electron density using Stark broadening of 308.22 nm
    Results of Saha-Boltzmann method
    Fig. 4. Results of Saha-Boltzmann method
    Spectral lines involved in the estimation of V1
    Fig. 5. Spectral lines involved in the estimation of V1
    Spectral lines involved in the estimation of V1 fitted by LSR
    Fig. 6. Spectral lines involved in the estimation of V1 fitted by LSR
    Spectral lines involved in the estimation of V2
    Fig. 7. Spectral lines involved in the estimation of V2
    TrainingSi/wt.%Mn/wt.%Mg/wt.%Al/wt.%
    No. 15.490.720.7291.16
    No. 26.600.520.5490.71
    No. 37.610.320.3390.55
    No. 48.290.550.5688.88
    No. 58.930.400.3989.12
    No. 610.200.260.2588.57
    No. 76.710.080.5192.07
    No. 88.400.380.3990.07
    No. 99.990.220.1288.61
    PredictionSi/wt.%Mn/wt.%Mg/wt.%Al/wt.%
    No. 109.300.620.2688.70
    No. 116.640.250.3591.65
    No. 127.410.710.7188.83
    No. 135.390.570.5691.06
    Table 1. Main elements content information in samples
    Plasma temperature/K$ w $/nm
    50000.00264
    100000.00261
    200000.00250
    400000.00234
    Table 2. Electron impact factor w of Al I 308.22 nm
    Wavelength/nmIonization degreeAccuracyAij/s−1giEi/eV Saha-BoltzmannEstimation of V1Estimation of V2
    308.22IB+5.87×10744.02YesYes-
    309.27IB+7.29×10764.02YesYes-
    265.25IB1.42×10724.67YesYes-
    256.80IB1.92×10744.83YesYes-
    257.51IC+3.60×10764.83YesYes-
    237.31IB9.07×10765.23YesYes-
    305.71I--67.67-Yes-
    232.16I--68.95-YesYes
    281.62IIA3.57×108111.82Yes-Yes
    466.31IIA+5.81×107313.26Yes--
    358.66IIA2.35×108915.30Yes--
    263.15IIB+2.48×108715.31Yes--
    Table 3. Al lines involved in estimating V1, V2 and Saha-Boltzmann method
    Wavelength/nmRatioEi/eV
    308.222.414.02
    309.272.444.02
    265.252.664.67
    256.803.054.83
    257.512.824.83
    237.313.015.23
    305.714.147.69
    232.164.348.95
    Table 4. The ratio of lines involved in the estimation of V1
    Samples25 mJ65 mJ
    RP/eVS-B/eVRERP/eVS-B/eVRE
    No. 101.271.187.6%1.491.490
    No. 111.241.166.9%1.551.512.6%
    No. 121.191.144.4%1.521.531%
    No. 131.231.175.1%1.481.512%
    Table 5. Comparison of two plasma temperature diagnosis methods
    Lines25 mJ/arb. units40 mJ/arb. units
    OriginalCorrected
    Al 308.22 nm0.741.031
    Al 309.27 nm0.771.061
    Al 281.62 nm0.490.871
    Al 466.31 nm0.460.981
    Si 288.16 nm0.711.061
    Mg 279.55 nm0.621.041
    Mn 259.37 nm0.650.951
    Table 6. Correction results of spectral lines involved in quantitative analysis
    LocAl/wt.%RESi/wt.%REMn/wt.%REMg/wt.%RE
    Ref88.70-9.30-0.62-0.26-
    No.101.5 m90.131.61%9.210.97%0.5511.29%0.247.69%
    2 m86.242.77%8.518.49%0.594.84%0.2311.54%
    2.4 m85.273.87%8.775.70%0.666.45%0.2911.54%
    2.7 m84.015.29%8.656.99%0.5019.35%0.3223.08%
    3 m85.423.70%8.0313.66%0.4920.97%0.3119.23%
    Ref91.65-6.64-0.25-0.35-
    No.111.5 m92.330.74%5.7713.10%0.4268.00%0.4425.71%
    2 m90.241.54%5.5716.11%0.3124.00%0.4528.57%
    2.4 m91.180.51%6.117.98%0.3540.00%0.328.57%
    2.7 m89.012.88%6.285.42%0.278.00%0.4220.00%
    3 m88.153.82%6.137.68%0.244.00%0.3911.43%
    Ref88.83-7.41-0.72-0.71-
    No.121.5 m92.273.87%7.572.16%0.788.33%0.767.04%
    2 m89.290.52%7.714.05%0.685.56%0.5719.72%
    2.4 m90.712.12%6.985.80%0.8213.89%0.732.82%
    2.7 m86.652.45%7.025.26%0.6312.50%0.8215.49%
    3 m84.145.28%7.987.69%0.711.39%0.6311.27%
    Ref91.06-5.39-0.57-0.56-
    No.131.5 m94.213.46%5.016.49%0.7226.32%0.6923.21%
    2 m93.072.21%5.183.90%0.537.02%0.518.93%
    2.4 m93.262.42%5.252.60%0.5110.53%0.7330.36%
    2.7 m87.144.30%5.174.08%0.4914.04%0.7432.14%
    3 m88.233.11%4.909.09%0.4422.81%0.7635.71%
    Table 7. Quantitative inversion results of 4 samples
    Xin Li, Zhengyi Lv, Bolun Cui, Jiaming Zhang, Ziying Liu, Xun Huang, Tianzhuo Zhao. Quantitative analysis of coaxial zoom laser-induced breakdown spectroscopy[J]. Infrared and Laser Engineering, 2023, 52(12): 20230310
    Download Citation