FU SHUFEN, CHEN JIANWEN, WANG ZHIJIANG, CAO HANCHING. E-beam interference and electron interferometer[J]. Acta Optica Sinica, 1986, 6(3): 257
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Experimental results of an electron interferometer are presented. The interferometer was set up by installing a Mollenstedt biprism in a JEM-200CX electron microscope. The configuration of the biprism and the optical system of the interference experiments are described in detail. The relation between the maximum number of obtainable interference fringes and the source brightness is discussed.