X-Ray Fluorescence Spectral Inspection of Plastic Express Packaging Bags Based on K-means and Within-Cluster Sum of Squared Errors

Zhuang Chen; Hong Jiang; Dingcheng Hao; Ji Man

doi:10.3788/LOP202259.1130001

Journals >Laser & Optoelectronics Progress >Volume 59 >Issue 11 >Page 1130001 > Article

Laser & Optoelectronics Progress
Vol. 59, Issue 11, 1130001 (2022)

X-Ray Fluorescence Spectral Inspection of Plastic Express Packaging Bags Based on K-means and Within-Cluster Sum of Squared Errors

Zhuang Chen¹, Hong Jiang^2、*, Dingcheng Hao³, and Ji Man⁴

Author Affiliations

¹Judicial Police Academy (Public Security Branch), Gansu University of Political Science and Law, Lanzhou 730000, Gansu , China

²School of Criminal Investigation, People's Public Security University of China, Beijing 100038, China

³Xigu Branch of Lanzhou City Public Security Bureau of Gansu Province, Lanzhou 730000, Gansu , China

⁴Beijing Huayi Hongsheng Technology Co., Ltd., Beijing 100123, China

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DOI: 10.3788/LOP202259.1130001 Cite this Article Set citation alerts

Zhuang Chen, Hong Jiang, Dingcheng Hao, Ji Man. X-Ray Fluorescence Spectral Inspection of Plastic Express Packaging Bags Based on K-means and Within-Cluster Sum of Squared Errors[J]. Laser & Optoelectronics Progress, 2022, 59(11): 1130001 Copy Citation Text

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