Property Analysis for Flat-Topped AWG Implemented with MMI

[in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]; [in Chinese]

Journals >Opto-Electronic Engineering >Volume 30 >Issue 5 >Page 25 > Article

Opto-Electronic Engineering
Vol. 30, Issue 5, 25 (2003)

Property Analysis for Flat-Topped AWG Implemented with MMI

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], and [in Chinese]

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[in Chinese]

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[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Property Analysis for Flat-Topped AWG Implemented with MMI[J]. Opto-Electronic Engineering, 2003, 30(5): 25 Copy Citation Text

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Abstract

[in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese], [in Chinese]. Property Analysis for Flat-Topped AWG Implemented with MMI[J]. Opto-Electronic Engineering, 2003, 30(5): 25

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