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Chinese Optics Letters
Vol. 22, Issue 3, 031701 (2024)

Stimulated emission–depletion-based point-scanning structured illumination microscopy

Lei Wang^1、2, Meiting Wang¹, Luwei Wang³, Xiaomin Zheng³, Jiajie Chen^3、*, Wenshuai Wu³, Wei Yan³, Bin Yu³, Junle Qu³, Bruce Zhi Gao⁴, and Yonghong Shao^3、**

Author Affiliations

¹Guangdong Key Laboratory for Biomedical Measurements and Ultrasound Imaging, National-Regional Key Technology Engineering Laboratory for Medical Ultrasound, School of Biomedical Engineering, Shenzhen University Medical School, Shenzhen 518060, China

²Key Laboratory of Opto-electronic Information Science and Technology of Jiangxi Province, Nanchang Hangkong University, Nanchang 330063, China

³College of Physics and Optoelectronics Engineering, Key Laboratory of Optoelectronic Devices and Systems of Ministry of Education and Guangdong Province, Shenzhen University, Shenzhen 518060, China

⁴Department of Bioengineering and COMSET, Clemson University, Clemson SC 29634, US

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DOI: 10.3788/COL202422.031701 Cite this Article Set citation alerts

Lei Wang, Meiting Wang, Luwei Wang, Xiaomin Zheng, Jiajie Chen, Wenshuai Wu, Wei Yan, Bin Yu, Junle Qu, Bruce Zhi Gao, Yonghong Shao. Stimulated emission–depletion-based point-scanning structured illumination microscopy[J]. Chinese Optics Letters, 2024, 22(3): 031701 Copy Citation Text

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References

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Lei Wang, Meiting Wang, Luwei Wang, Xiaomin Zheng, Jiajie Chen, Wenshuai Wu, Wei Yan, Bin Yu, Junle Qu, Bruce Zhi Gao, Yonghong Shao. Stimulated emission–depletion-based point-scanning structured illumination microscopy[J]. Chinese Optics Letters, 2024, 22(3): 031701

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