Investigation of dimensionality in superconducting NbN thin film samples with different thicknesses and NbTiN meander nanowire samples by measuring the upper critical field

Mudassar Nazir; Xiaoyan Yang; Huanfang Tian; Pengtao Song; Zhan Wang; Zhongcheng Xiang; Xueyi Guo; Yirong Jin; Lixing You; Dongning Zheng

doi:10.1088/1674-1056/ab9740

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