Journals
Advanced Photonics
Photonics Insights
Advanced Photonics Nexus
Photonics Research
Advanced Imaging
View All Journals
Chinese Optics Letters
High Power Laser Science and Engineering
Articles
Optics
Physics
Geography
View All Subjects
Conferences
CIOP
HPLSE
AP
View All Events
News
About CLP
Search by keywords or author
Login
Registration
Login in
Registration
Search
Search
Articles
Journals
News
Advanced Search
Top Searches
metasurface
laser
nir
optical coherence tomography
Lithium niobate
OAM
Journals >
Acta Optica Sinica >
Volume 40 >
Issue 13 >
Page 1329001 > Article
Acta Optica Sinica
Vol. 40, Issue 13, 1329001 (2020)
A Sub-Aperture Scanning Fourier Transform System for Fast BRDF Measurements
Min Lu
*
, Zhile Wang, Pingping Gao
*
, Shuqing Zhang, and Jikai Guo
Author Affiliations
Research Center for Space Optical Engineering, Harbin Institute of Technology, Harbin, Heilongjiang 150001, China
show less
DOI:
10.3788/AOS202040.1329001
Cite this Article
Set citation alerts
Min Lu, Zhile Wang, Pingping Gao, Shuqing Zhang, Jikai Guo. A Sub-Aperture Scanning Fourier Transform System for Fast BRDF Measurements[J]. Acta Optica Sinica, 2020, 40(13): 1329001
Copy Citation Text
EndNote(RIS)
BibTex
Plain Text
show less
Cited By
Article index updated: May. 28, 2024
Citation counts are provided from Researching.
The article is cited by
2
article(s) from Researching.
Abstract
Get PDF(in Chinese)
Figures&Tables (13)
Equations (0)
References (13)
Cited By (2)
Get Citation
Copy Citation Text
Min Lu, Zhile Wang, Pingping Gao, Shuqing Zhang, Jikai Guo. A Sub-Aperture Scanning Fourier Transform System for Fast BRDF Measurements[J]. Acta Optica Sinica, 2020, 40(13): 1329001
Download Citation
EndNote(RIS)
BibTex
Plain Text
Set citation alerts for the article
Tools
Share
Set citation alerts for the article
Save the article for my favorites
Paper Information
Category: Scattering
Received: Feb. 14, 2020
Accepted: Apr. 1, 2020
Published Online: Jul. 2, 2020
The Author Email: Lu Min (18243087454@163.com), Gao Pingping (18243087454@163.com)
DOI:
10.3788/AOS202040.1329001
Recommended Topics
laser devices and laser physics
Lasers and Laser Optics
Laser physics
laser manufacturing
Instrumentation, Measurement and Metrology
Set citation alerts for the article
Please enter your email address
Cancel
Confirm