• Opto-Electronic Engineering
  • Vol. 38, Issue 5, 86 (2011)
LIU Hui-jun1、*, SUN Bin1, and CHEN Hua-cai2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: Cite this Article
    LIU Hui-jun, SUN Bin, CHEN Hua-cai. Shelf-life Identification Method of Different Origin Apples Based on Near Infrared Spectroscopy[J]. Opto-Electronic Engineering, 2011, 38(5): 86 Copy Citation Text show less

    Abstract

    The shelf-life identification method of different origin apples based on near infrared diffuse reflectance spectroscopy at normal atmospheric temperature was proposed. 20 each of the Fuji apple produced in Shandong and Shanxi were bought from the market respectively, and the spectrum of the samples were measured by the purchase date and after the storage of one week (7d). The spectrum of Shandong apple measured at two times were defined as class 1 and class 2, class 3 and class 4 of Shanxi, the absorbance of 1 420 nm and 1 630 nm increased at different degree after the storage of one week. A few preprocessing was compared, and there was litter difference between the sample spectrum analyze by the Principal Component Analysis (PCA) of two kinds. The top 15 variables of the total contribution rate of 97.78% extracted by PCA were input into the radial neural network, and shelf-life identification of different origin apples based on near infrared diffuse reflectance spectroscopy were built. 20 samples in the four classes were chosen as the predicated set. The recognition rates in the calibration set and prediction set were 100%, and the prediction accuracy of 18 samples was higher than 93%. The result shows that a new method proposed by study indicates the shelf-life of different origin apples rapidly.
    LIU Hui-jun, SUN Bin, CHEN Hua-cai. Shelf-life Identification Method of Different Origin Apples Based on Near Infrared Spectroscopy[J]. Opto-Electronic Engineering, 2011, 38(5): 86
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