• Laser & Optoelectronics Progress
  • Vol. 50, Issue 6, 61201 (2013)
Cui Gaozeng1、2、*, Liu Tao1、3, Li Guoguang1、3, Guo Xia2, and Xia Yang1
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
  • 3[in Chinese]
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    DOI: 10.3788/lop50.061201 Cite this Article Set citation alerts
    Cui Gaozeng, Liu Tao, Li Guoguang, Guo Xia, Xia Yang. A Method to Measure the Misalignment Angle of the Optical Axes of Biplate Compensators[J]. Laser & Optoelectronics Progress, 2013, 50(6): 61201 Copy Citation Text show less
    References

    [1] Joungchel Lee, P. I. Rovira, Ilsin An et al.. Alignment and calibration of the MgF2 biplate compensator for applications in rotating-compensator multichannel ellipsometry [J]. Opt. Soc. Am. A, 2001, 18(8): 1980~1985

    [2] Liphardt Martin, Johs Blaine, Hale Jeffrey et al.. Spectroscopic Ellipsometer and Polarimeter Systems [P]. US Patent 7336361 B1, 2008-12-28

    [3] Li Fanyue, Han Jie, Zeng Aijun et al.. Method for measuring retardation by swinging quarter-wave plate with phase modulator [J]. Chinese J. Lasers, 2011, 38(2): 0208003

    [4] Wang Jun, Chen Lei, Wu Quanying et al.. Retardation measurement of waveplates using white-light Michelson interferometer [J]. Chinese J. Lasers, 2011, 38(5): 0508001

    [5] Hou Junfeng, Wang Dongguang, Deng Yuanyong et al.. Phase retardation measurement with least square fitting method [J]. Acta Optica Sinica, 2011, 31(8): 0812001

    [6] Bruno Boulbry, Bruno Bousquet, Bernard Le Jeune. Polarization errors associated with zero-order achromatic quarter-wave plates in the whole visible spectral range [J]. Opt. Express, 2001, 9(5): 225~235

    [7] Boulbry, B. Le Jeune, F. Pellen et al.. Identification of error parameters and calibration of a double-crystal birefringent wave plate with a broadband spectral light source [J]. Appl. Opt., 2002, 35(20): 2508~2515

    [8] D. E. Aspnes Alignment of an optically active biplate compensator [J]. Appl. Opt., 1971, 10(11): 2545~2546

    [9] Hiroyuki Fujiwara. Spectroscopic Ellipsometry: Principles and Applications [M]. Tokyo: Maruzen Co., Ltd., 2003. 81~89

    [10] R. M. A. Azzam, N. M. Bashara. Ellipsometry and Polarized Light [M]. Amsterdam: North-Holland Publishing Company,1977

    Cui Gaozeng, Liu Tao, Li Guoguang, Guo Xia, Xia Yang. A Method to Measure the Misalignment Angle of the Optical Axes of Biplate Compensators[J]. Laser & Optoelectronics Progress, 2013, 50(6): 61201
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