• Chinese Journal of Quantum Electronics
  • Vol. 20, Issue 6, 685 (2003)
[in Chinese]*, [in Chinese], and [in Chinese]
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  • [in Chinese]
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    [in Chinese], [in Chinese], [in Chinese]. Object Detection Through Polarization Characteristics[J]. Chinese Journal of Quantum Electronics, 2003, 20(6): 685 Copy Citation Text show less
    References

    [1] Blackman S, Popoli R. Design and Analysis of Modern Tracking Systems [M]. Boston. London: Artech House,1999. 29-147

    [2] McCaughrean M J, et al. High-resolution near-infrared imaging of the orion 1142426 silhouette disk [J]. The Astrophysical Journal, 1998, 49(L): 157-161

    [3] Wolff L B. Polarization-based material classification from specular reflection [J]. IEEE Trans. on Pattern Analysis and Machine Intelligence, 1990, 12(11): 1059-1071

    [4] Vanderbiltn V C, De Venecia K J. Specular, diffuse and polarized imagery of an oat canopy [J]. IEEE Trans. on Geosci. and Remote Sens., 1988, 26(4): 451-462

    [5] Wolff L B, Mancini T A, et al. Liquid crystal polarization camera [J]. IEEE Trans. on Robotics and Automation,1997, 13(2): 195-203

    [6] Chun C S, et al. Automatic target recognition using polarization-sensitive thermal imaging [C] // SPIE Proceedings, 1995, 2485:353-364

    CLP Journals

    [1] Tang Peijun, Chen Feihu, Tang Zhilie. Visualization of Polarization State and Its Imaging Method[J]. Acta Optica Sinica, 2013, 33(8): 826002

    [2] CHEN Chao, ZHAO Yong-qiang, CHENG Yong-mei, PAN Quan, LUO Li. Materials Classification Based on Spectropolarimetric BRDF Imagery[J]. Acta Photonica Sinica, 2010, 39(6): 1026

    [in Chinese], [in Chinese], [in Chinese]. Object Detection Through Polarization Characteristics[J]. Chinese Journal of Quantum Electronics, 2003, 20(6): 685
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