[1] J. A. Cline, M.Isaason. Probe-sample interaction in reflection near-field scanning optical microscopy[J]. Appl. Opt., 1995, 34(22): 4869～4876
[2] F. Zenhausern, M. P. O′Boyle, H. K. Wickramsinghe. Apertureless near-field optical microscopy[J]. Appl. Phys. Lett., 1994, 65(13): 1623～1625
[7] P. L. Phillips, J. C. Knight, J. M. Pottage. Direct measurement of optical phase in the near field[J]. Appl. Phys. Lett., 2000, 76(5): 541～543
[8] H. F. Hamann, A. Gallagher, D. J. Nesbitt. Enhanced sensitivity near-field scanning optical microscopy as high resolution[J]. Appl. Phys. Lett., 1998, 73(11): 1469～1471
[9] R. Hillenbrand, F. Keilmann. Optical oscillation modes of plasmon particles observed in direct space by phase-contrast near-field microscopy[J]. Appl. Phys. B, 2001, 73(3): 239～243
[10] B. Knoll, F. Keilmann. Enhanced dielectric contrast in scattering-type scanning near-field optical microscopy[J]. Opt. Commun., 2000, 182(4): 321～328
[11] Antonello Nesci, René Dndliker, Hans Peter Herzig. Quantiative amplitude and phase measurement by use of a heterodyne scanning near-field optical microscope[J]. Opt. Lett., 2001, 26(4): 208～210
[12] R. Hillenbrand, F. Keilmann. Complex optical constants on subwavelength scale[J]. Phys. Rev. Lett., 2000, 85(14): 3029～3032
[13] M. Xiao. Theoretical treatment for scattering near-field optical microscopy[J]. J. Opt. Soc. Am. A, 2001, 14(11): 2977～2984
[14] M. Xiao. On near-field scanning optical microscopy: Homogeneous and evanescent radiation[J]. J. Modern Optics, 1997, 44(2): 327～344
[15] M. Xiao, S. Bozhevolnyi, O. Keller. Numerical study of configurational resonances in near-field optical microscopy with a mesoscopic metallic probe[J]. Appl. Phys. A, 1996, 62(1): 115～121
[16] Tero Setl, Matti Kaivola, Ari T.Friberg. Evanescent and propagating electromagnetic fields in scattering form point-dipole structures[J]. J. Opt. Soc. Am. A, 2001, 18(3): 678～688
