[1] Li Hongzheng. Discussion of SiGe BiCMOS technology process integration[J]. Electronics and Packaging, 2012, 15(12): 34-37. (in Chinese)
[2] Rao J B L, Mital R, Patel D P, et al. Low-cost phased array antenna for satellite communications on mobile earth stations[C]//IEEE International Symposium on Phased Array Systems & Technology, 2013: 214-219.
[4] Cao Zhou, Xue Yuxiong, Yang Shiyu, et al. Laser simulation of single event effects[J]. Vacuum and Cryogenics, 2006, 12(3): 166-172. (in Chinese)
[5] Chugg A, Jones R, Moutrie M, et al. Probing the charge-collection sensitivity profile using a picosecond pulsed laser at a range of wavelength[J]. IEEE Transactions on Nuclear Science, 2002, 49(6): 2969-2976.
[6] Buchner Stephen P, Florent Miller, Vincent Pouget, et al. Pulsed-laser testing for single-event effects investigations[J]. IEEE Transactions on Nuclear Science, 2013, 60(3): 1852-1875.
[7] Pease R L, Sternberg A L, Boulghassoul Y, et al. Comparison of SET′s in bipolar linear circuits generated with an ion microbeam, laser light and circuit simulation[J]. IEEE Transactions on Nuclear Science, 2002, 49(6): 3163-3170.
[8] Wang Dekun, Cao Zhou, Liu Hainan, et al. Backside piuse laser testing for single event effect[J]. Atomic Energy Science and Technology, 2011, 45(7): 884-887.(in Chinese)
[9] Egorov A N, Chumakov A I, Mavritskiy O B, et al. Femtosecond laser simulation facility for SEE IC testing[C]// 2014 IEEE Radiation Effects Data Workshop Record, 2014: 247-250.
[10] Gordienko A V, Mavritskii O B, Egorov A N, et al. Correlation of the ionisation response at selected points of IC sensitive regions with SEE sensitivity parameters under pulsed laser irradiation[J]. Quantum Electronics, 2014, 44(12): 1173-1178.
[11] Armstrong S E, Loveless T D, Hicks J R, et al. Phase-dependent single-event sensitivity analysis of high-speed A/MS circuits extracted from asynchronous measurements[J]. IEEE Transactions on Nuclear Science, 2010, 58(6): 1066-1071.
[12] Wang Hongbo, Li Qin. Radiation effects and protection technology for optical componentsof fiber optic gyroscope[J]. Infrared and Laser Engineering, 2015, 44(2): 682-687. (in Chinese)