[1] Turk M，Pentland A. Eigenfaces for recognition [J]. Journal of Cognitive Neuroscience(S0898-929X)，1991，3(1)：71-86.

[2] Etenmad K，Chellappa R. Discriminant analysis for recognition of human face image [J]. Journal of the Optical Society of America A(S1520-8540)，1997，14(8)：1724-1733.

[3] Barlett M S，Movellan J R，Sejnowski T J. Face Recognition By Independent Component Analysis [J]. IEEE Transactions on Neural Networks(S1045-9227)，2002，13(6)：1450-1464.

[4] Ojala T，Pietikainen M，Harwood D. A comparative study of texture measures with classification based on feature distributions[J]. Pattern Recognition(S0031-3203)，1996，29(1)：51-59.

[5] Penev P S，Atick J J. Local Feature Analysis：A General Statistical Theory for Object Representation [J]. Network：Comput. Neural Syst(S0954-898X)，1996，7(3)：477-500.

[6] Daugman J G. Uncertainty relation for resolution in space，spatial frequency，and orientation optimized by two-dimensional visual cortical filters [J]. Journal of the Optical Society of America A(S1520-8540)，1985，2(7)：1160-1169.

[7] Ahonen T，Hadid A，Pietikainen M. Face Description with Local Binary Patterns：Application to FaceRecognition [J]. IEEE Transactions on Pattern Analysis And Machine Intelligence(S0162-8828)，2006，28(12)：2037-2041.

[10] WANG Wei，HUANG Fei-fei，LI Jian-wei. Face Description and Recognition by LBP Pyramid [J]. Journal of Computer-aided

     Design & Computer Graphics，2009，21(1)：94-100，106.

[11] Ojala T，Pietikainen M，Maenpaa T. Multiresolution gray-scale and rotation invariant texture classification with local binary patterns [J]. IEEE Transactions on Pattern Analysis and Machine Intelligence(S0162-8828)，2002，24(7)：971-987.

[12] GUO Zhen-hua，ZHANG Lei，ZHANG David. A Completed Modeling of Local Binary Pattern Operator for Texture Classification [J]. IEEE Transactions on Image Processing(S1057-7149)，2010，19(6)：1657-1663.

[13] Varma M，Zisserman A. Texture classification：are filter banks necessary [C]//Computer Society Conference on Computer Vision and Pattern Recognition(CVPR03)，Madison，Wisconsin，June 18-20，2003：691-698.

[14] Varma M，Zisserman A. A statistical approach to material classification using image patch examplars [J]. IEEE Transactions on Pattern Analysis and Machine Interlligence(S0162-8828)，2009，31(11)：2032-2047.