• Laser & Optoelectronics Progress
  • Vol. 53, Issue 4, 43101 (2016)
Li Guolong1、2、*, Zhong Jingming1, Wang Lihui1, Li Jin2, He Lijun2, Li Haibo2, and Gao Mangmang2
Author Affiliations
  • 1[in Chinese]
  • 2[in Chinese]
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    DOI: 10.3788/lop53.043101 Cite this Article Set citation alerts
    Li Guolong, Zhong Jingming, Wang Lihui, Li Jin, He Lijun, Li Haibo, Gao Mangmang. Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method[J]. Laser & Optoelectronics Progress, 2016, 53(4): 43101 Copy Citation Text show less
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    Li Guolong, Zhong Jingming, Wang Lihui, Li Jin, He Lijun, Li Haibo, Gao Mangmang. Determination of Optical Constants and Thickness of Polymer Semiconductor Thin Film by Reflectivity Fitting Method[J]. Laser & Optoelectronics Progress, 2016, 53(4): 43101
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