• Spectroscopy and Spectral Analysis
  • Vol. 31, Issue 8, 2081 (2011)
HAO Hui-min1、2, LI Shi-wei3, ZHANG Wen-dong1, LI Peng-wei1, HAO Jun-yu2, LU Hai-ning2, Ken Jia4, and ZHANG Yong5
Author Affiliations
  • 1Micro/Nano System Research Center, Taiyuan University of Technology, Taiyuan 030024, China
  • 2Automation Company of TISCO, Taiyuan 030003, China
  • 3Northwest Institute of Nuclear Technology, Xi’an 710024, China
  • 4Department of Research and Development, Brimrose Corporation of America, Baltimore 21152-9201, USA
  • 5State Key Laboratory of Electrical Insulation for Power Equipment, Xi’an Jiaotong University, Xi’an 710049, China
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    DOI: 10.3964/j.issn.1000-0593(2011)08-2081-05 Cite this Article
    HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2081 Copy Citation Text show less
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    [17] Hao Huimin. Study on Quantitative Analysis Methods for Multi-component Gaseous Mixture by Infrared Spectroscopy Based on Kernel Method. Xi’an: Xi’an Jiaotong University, Doctoral Thesis, 2008. 74.

    HAO Hui-min, LI Shi-wei, ZHANG Wen-dong, LI Peng-wei, HAO Jun-yu, LU Hai-ning, Ken Jia, ZHANG Yong. Thickness Measurement of Insulation Coating by NIR Spectrometry Based on Boosting-KPLS[J]. Spectroscopy and Spectral Analysis, 2011, 31(8): 2081
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