Predicting the Copper Pollution Information of Corn Leaves Spectral Based on an IWD-Hankel-SVD Model

ZHANG Jian-hong; YANG Ke-ming; HAN Qian-qian; LI Yan-ru; GAO Wei

doi:10.3964/j.issn.1000-0593(2021)05-1505-08

Journals >Spectroscopy and Spectral Analysis >Volume 41 >Issue 5 >Page 1505 > Article

Spectroscopy and Spectral Analysis
Vol. 41, Issue 5, 1505 (2021)

Predicting the Copper Pollution Information of Corn Leaves Spectral Based on an IWD-Hankel-SVD Model

ZHANG Jian-hong^*, YANG Ke-ming, HAN Qian-qian, LI Yan-ru, and GAO Wei

Author Affiliations

[in Chinese]

show less

DOI: 10.3964/j.issn.1000-0593(2021)05-1505-08 Cite this Article

ZHANG Jian-hong, YANG Ke-ming, HAN Qian-qian, LI Yan-ru, GAO Wei. Predicting the Copper Pollution Information of Corn Leaves Spectral Based on an IWD-Hankel-SVD Model[J]. Spectroscopy and Spectral Analysis, 2021, 41(5): 1505 Copy Citation Text

show less

References

[2] Toth G, Hermann T, Da Silva MR, et al. Environment International. 2016, 88: 299.

[3] Shi T, Wang J, Chen Y, et al. International Journal of Applied Earth Observation and Geoinformation, 2016, 52: 95.

[5] Liu M L, Wang T J, Skidmore A K, et al. Science of the Total Environment, 2018, 637: 18.

[9] Maisto G, Santorufo L, Arena C. Journal of Plant Nutrition and Soil Science, 2013, 176: 776.

[10] Frei M G, Osorio I. Proceedings of the Royal Society A-Mathematical Physical and Engineering Sciences, 2007, 463（2078）: 321.

[14] Liu S, Liu X, Hou J, et al. Science in China Series E-Technological Sciences, 2008, 51: 202.

[15] Delegido J, Verrelst J, Alonso L, et al. Sensors, 2011, 11: 7063.

Download Citation

Save the article for my favorites

Paper Information