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    Journals >Opto-Electronic Engineering >Volume 30 >Issue 2 >Page 28 > Article
    • Opto-Electronic Engineering
    • Vol. 30, Issue 2, 28 (2003)
    A 3-D measuring method with grating projection
    [in Chinese], [in Chinese], and [in Chinese]
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  • [in Chinese]
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    DOI: Cite this Article
    [in Chinese], [in Chinese], [in Chinese]. A 3-D measuring method with grating projection[J]. Opto-Electronic Engineering, 2003, 30(2): 28 Copy Citation Text show less
    References

    [3] KALLA K U, HOLMA H J. Absolute calibration of photometer physical chemical earth (B)[J]. Applied Optics, 2000,25(5):467-470.

    [5] ZHANG Z, DERICHE R, FAUGERAS O,et al. A robust technique for matching two uncalibrated images through the recovery of the unknown epipolar geometry[J]. Artificial Intelligence J ,1995,78(1):87-119.

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    [in Chinese], [in Chinese], [in Chinese]. A 3-D measuring method with grating projection[J]. Opto-Electronic Engineering, 2003, 30(2): 28
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